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嵌入式OS--4G手機(jī)操作系統(tǒng)

手機(jī)/網(wǎng)絡(luò)/動(dòng)漫游戲開發(fā)

嵌入式OS--WinCE

單片機(jī)培訓(xùn)

嵌入式硬件設(shè)計(jì)

電子電路設(shè)計(jì)

嵌入式OS--VxWorks

PowerPC嵌入式系統(tǒng)/編譯器優(yōu)化

3G手機(jī)軟件測試、硬件測試

云計(jì)算、物聯(lián)網(wǎng)

開源操作系統(tǒng)Tiny OS開發(fā)

　

　

公益培訓(xùn)通知與資料下載

曙海招聘啟示

　　培訓(xùn)班新動(dòng)態(tài) 　

Overview
This workshop discusses at-speed faults and how to use TetraMAX for at-speed test. Topics include description, recommendation, and scripts of transition, small-delay defect, and path-delay fault model ATPG. Also covered are the Onchip Clock Controller (OCC) flow, which leverages the PLL fast clocks, and using PrimeTime to generate the necessary data for at-speed test. Hands-on labs follow each training module, allowing you to apply the skills learned in lecture. Labs include: using PrimeTime to generate the necessary files for at-speed ATPG; generating the patterns for different fault models in Tetramax; and, finally, using VCS for simulating the patterns generated. Objectives At the end of this workshop the student should be able to:

• Describe the need for At-Speed testing
• List the At-Speed fault models available
• Describe the two launch techniques for at-speed faults
• Successfully edit a stuck-at SPF file to suit at-speed fault model
• Define the timing exceptions
• Automate the process of script generation for TetraMAX, using PrimeTime. This script will take care of the false and multi-cycle paths
• Modify a given stuck-at fault model script to run for an at-speed fault model
• State the steps required to merge transition and stuck-at fault patterns to reduce the overall patterns
• Automatically create scripts that can be used in PrimeTime to perform test mode STA
• Describe the SDD flow
• Describe the flow needed to successfully use the PLL present in your design to give the at-speed clock during capture mode
• State the steps needed to perform path-delay ATPG
• Understand the fault classification in path-delay ATPG

Audience Profile
Engineers who use ATPG tools to generate patterns for different fault models.Prerequisites
To benefit the most from the material presented in this workshop, you should: A. Have taken the TetraMAX 1 workshop. OR B. Possess knowledge in the following areas:

• Scan Architecture and ATPG
• Stuck-At fault model ATPG with TetraMAX
• SPF file

Course Outline Module 1

• Introduction of At-Speed defects
• Source of Test Escapes and chip failure
• Requirements for At-Speed testing
• Popular fault models for At-Speed testing

Module 2

• Transition Fault model
• Path Delay Fault model
• At-Speed Fault Detection Method
• Techniques to Launch and Capture a Fault

Module 3

• STIL file
• Modifications to STIL file for At-Speed testing
• Generic Capture Procedures

Module 4

• Timing Exceptions
• Automated Way to Generate Timing Exceptions form PrimeTime

Module 5

• TetraMAX Scripts for Transition ATPG
• Design Guidelines
• Flow Considerations and Requirements
• Pattern Merging
• Automated way to generate the scripts for PrimeTime to perform testmode STA

Module 6

• What is a Small Delay Defect ATPG
• How to use PrimeTime to Generate the Slack Data
• ATPG Flow in TetraMAX

Module 7

• Requirement of PLL for At-speed faults
• The various clocks in PLL flow
• Use QuickSTIL to generate the SPF

Module 8

• TetraMAX scripts for Path Delay ATPG
• Fault Classification for Path Delay Faults
• Generating Paths for TetraMAX Using PrimeTime
• Reconvergence Paths
• Hazard Simulation

Module 9

• Conclusion
• Topics Covered
• Fault model and Features of TetraMAX
• Solvnet Resources